Himalayan Geology, Vol. 24 (2), 2003, pp. 117-119, Printed in India

Determination of Major and Trace elements in Silicate reference samples using XRF and ICP-AES techniques : a comparative study

N.K. SAINI, P.P. KHANNA, P.K. MUKHERJEE & M.S. RATHI
Wadia Institute of Himalayan Geology, Dehra Dun 248 001, India

Standard configurations of an Energy Dispersive X-ray Fluorescence spectrometer (EDXRF) and an Inductively Coupled Plasma Atomic Emission Spectrophotometer (ICP-AES) were used to determine eight major (Mg, Al, Si, P, Ca, Ti, Mn and Fe) and nine trace (Cu, Co, Cr, Nb, Ni, Sr, Y, Zn and Zr) elements in five well characterised silicate reference samples produced by Geological Survey of Japan (GSJ). A comparison of the analysed data shows reasonable consistency among the determinations by both techniques for most of the elements.